AEM 005 - Scanning Transmission Electron Microscopy and Nanoprobe Analysis
Course Description
Certificate V
Scanning Transmission Electron Microscopy and Nanoprobe Analysis
- May 11 2015, STEM optics and high resolution Z contrast imaging (1.5h).
- May 11 2015, STEM/EDX experimental setup, spectrum acquisition, quantification, line, spectrum imaging (1.5h)
- May 12 2015, GIF and EELS spectrum acquisition (1.5h)
- May 12 2015, STEM/EELS quantification and experimental setup (1.5h)
- May 13 2015, EFTEM and ELNES(3h)
- May 14 2015, Device process contamination, residue, interface chemical analysis with a combination of STEM/EDX/EELS (1.5h)
- May 14 2015, STEM CBED analysis (1.5)
- May 15 2015, Nanoparticle composition analysis synthesis (1.5h)
- May 15 2015, Metallic grain boundary and coating interfacial chemical analysis (1.5h)
STEM/Lab
- May 11 2015, STEM Alignment and Z contrast imaging (2h).
- May 11 2015, EDX Data processing (2h)
- May 11 2015, Nano diffraction and strain analysis Part I (2h)
- May 12 2015, GIF tuning and EELS spectrum acquisition (2h)
- May 12 2015, EELS spectrum processing (2h)
- May 12 2015, Nano diffraction and strain analysis Part II (2h)
- May 13 2015, STEM/EELS quantification and experimental setup (2h)
- May 13 2015, EELS quantification (2h)
- May 13 2015, Nano diffraction and strain analysis Part III (2h)
- May 14 2015, EFTEM mapping acquisition (2h)
- May 14 2015, offline EFTEM mapping generation (2h)
- May 14 2015, Nano diffraction and strain analysis Part IV (2h)
- May 15 2015, CBED acquisition at STEM mode (2h)
- May 15 2015, Case studies (2h)
- May 15 2015, Certificate exam (1h)
Applies Towards the Following Certificates
- Engineering Certificate in Applied Electron Microscopy : Individual Electron Microscopy Course Listings