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Course Description

Certificate V

Scanning Transmission Electron Microscopy and Nanoprobe Analysis

 

 

  1. May 11 2015, STEM optics and high resolution Z contrast imaging (1.5h).
  2. May 11 2015, STEM/EDX experimental setup, spectrum acquisition, quantification, line, spectrum imaging (1.5h)
  3. May 12 2015, GIF and EELS spectrum acquisition (1.5h)
  4. May 12 2015, STEM/EELS quantification and experimental setup (1.5h)
  5. May 13 2015, EFTEM and ELNES(3h)
  6. May 14 2015, Device process contamination, residue, interface chemical analysis with a combination of STEM/EDX/EELS (1.5h)
  7. May 14 2015, STEM CBED analysis (1.5)
  8. May 15 2015, Nanoparticle composition analysis synthesis (1.5h)
  9. May 15 2015, Metallic grain boundary and coating interfacial chemical analysis (1.5h)
 

 

STEM/Lab

 

  1. May 11 2015, STEM Alignment and Z contrast imaging (2h).
  2. May 11 2015, EDX Data processing (2h)
  3. May 11 2015, Nano diffraction and strain analysis Part I (2h)
  4. May 12 2015, GIF tuning and EELS spectrum acquisition (2h)
  5. May 12 2015, EELS spectrum processing (2h)
  6. May 12 2015, Nano diffraction and strain analysis Part II (2h)
  7. May 13 2015, STEM/EELS quantification and experimental setup (2h)
  8. May 13 2015, EELS quantification (2h)
  9. May 13 2015, Nano diffraction and strain analysis Part III (2h)
  10. May 14 2015, EFTEM mapping acquisition (2h)
  11. May 14 2015, offline EFTEM mapping generation (2h)
  12. May 14 2015, Nano diffraction and strain analysis Part IV (2h)
  13. May 15 2015, CBED acquisition at STEM mode (2h)
  14. May 15 2015, Case studies (2h)
  15. May 15 2015, Certificate exam (1h)
 

 

Applies Towards the Following Certificates

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